Nitrogen Plasma Immersion Ion Implantation (PIII) has been used to modify the surface chemical structure of Ultra High Molecular Weight Polyethylene (UHMWPE). Grinding and polishing processes based on abrasive papers and alumina pastes have been evaluated with regard to their results on the improvement of polymer surface roughness, which has shown to be of crucial importance for hardness characterization. Raman spectroscopy, XPS, and Nanoindentation tests were used to characterize the modified surfaces. Experimental results has shown that UHMWPE surface mechanical properties such as hardness and elastic modulus can be improved by induced chain cross-linking between the macromolecules on the polymer surface caused by nitrogen PIII. The new material formed on the surface is Diamond Like Carbon (DLC). As a significant improvement in hardness was obtained by DLC synthesis on the treated surface, it is expected a dramatic improvement of abrasion resistance and overall durability of prostheses made with PIII treated UHMWPE.

SAE 1020 is a widely used plain carbon steel, as mortar reinforcement in buildings and small machine parts. But aside from good mechanical properties, its surface suffer from severe corrosion and high wear rate, due to modest hardness. Chromium (Cr) in excess of 12% in Fe alloys renders them resistant to several corrosive attacks. So we tried to introduce Cr in such amounts into the surface of that steel. Cr films were deposited by electron beam on SAE 1020 steel. Bombarding the Cr film either by nitrogen Plasma Immersion Ion Implantation (PIII) or nitrogen ion beam (IB), Cr atoms were recoil introduced into the Fe matrix. Normally, in the recoil process, heavy atoms are used, but in this set of experiments we used a relatively lighter atom, viz. nitrogen. SRIM simulation was used to show Cr atoms range in the steel matrix after being hit by nitrogen atoms. AES analysis showed ranges far beyond the calculated figures and in percentages above 13at. %, enough to the purposes of these works. Preliminary corrosion results showed remarkable enhancement under corrosive attack.

In the present study we use x-ray diffraction methods to characterize the surface of Si wafers irradiated with nitrogen by Plasma Immersion Ion Implantation. This is a non-line-of-sight ion implantation method, which allows three-dimensional treatment of materials including semiconductors, metals and dielectrics. The atomic concentration profiles in the implanted Si wafers were measured by Auger electron spectroscopy. The (004) Si rocking curve ( omega-scan) was measured in a high resolution x-ray diffractometer equipped with a Ge (220) four-crystal monochromator before and after implantation. A distortion of the Si (004)-rocking curve was clearly observed for the as-implanted sample. This rocking curve was successfully simulated by dynamical theory of x-ray diffraction, assuming a Gaussian strain profile through the implanted region. The analysis made by x-ray difraction and Auger electron spectroscopy revealed successful implantation of ions with ac- cumulated nitrogen dose of 1.5 x <FONT FACE=Symbol>10(17) </FONT>cm-3 .The Si wafers can be used as high sensitivity monitors in the Plasma Immersion Ion Implantation process, especially at the low dose range.